Research Facilities | |
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Dual ion beam sputtering (DIBS) system to deposit: Inorganic oxides/nitrides/dielectrics (SiO2, TiO2, Si3N4, ZrO2, ITO, HfO2 etc.); Metals (Au, Ti, Al, Pt etc.); Semiconductors (ZnO etc.) |
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Four Probe Hall Measurement System: To measure: carrier concentration, type of doping, carrier mobility |
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Gas and VOC Sensor Set-up: Resistive and capacitive sensitivity measurement set-up |
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Rapid Thermal Processing (RTP): Rapid thermal annealing under various gas atmoshphere |
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De-ionized Water: Remove particulates > 0.5 micron, ions, organics and bacteria Conductivity upto 1 uS/cm |
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Spin Coater: Thin-film deposition technique in which material is grown by sol-gel and hydrothermal method |
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Convection Oven: Temperature range: Upto 300 oC |
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Fumehood with Blower: To perform: Wet chemical processing |
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Keithley 4200A-SCS Parameter Analyzer: The Semiconductor parametric analyzer, delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements |
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Electrochemical Synthesis: Electrochemical current-voltage measurement set-up |
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Annealing Furnace: To perform: Annealing (up to 1000 oC) under vacuum or gas atmosphere |
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Variable-angle, Variable-wavelength Spectroscopic Ellipsometry: To measure: transmission, reflection, thickness, optical properties of materials |
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Solar Simulator System: To measure: VOC, ISC and PCE of solar cells at different temperature |
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Quantum Efficiency Measurement System: To measure: A monolithic, turnkey solution for photovoltaic material and device spectral characterization including EQE and IQE |
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Cryogenic Vacuum Probe Station: To measure: Device characteristics at different ambient conditions |
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Computational Work Station: Device simulation such as Density Functional Theory, MOSFET, BJT, OFET, LED, Quantum well, Solar Cell, TFT, OTFT, OLED |
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