Study of surface and interfaces through x-ray scattering: x-ray reflectivity (XRR), grazing incidence small angle x-ray scattering (GISAXS), grazing incidence diffraction (GID)
Worked as principal investigator for x-ray scattering experiments with synchrotron at Advanced Photon Source (APS), Argonne National Laboratory, at National Synchrotron Light Source (NSLS), Brookhaven National Laboratory, USA, at PETRA III, DESY, Germany. X-ray scattering Lab set up at IIT Indore.
UV-Vis, IR/FTIR, Raman and Photoluminescence (PL) spectroscopy, Secondary Ion Mass Spectroscopy (SIMS), X-ray Photoelectron Spectroscopy (XPS), Ellipsometry.
Vacuum ultra violet (VUV) spectroscopy and X-ray Absorption Spectroscopy (XAS) using Synchrotron radiation at ELETTRA, Italy.
Atomic Force Microscopy (AFM), Transmission Electron Microscopy (TEM) along with Electron Energy Loss Spectroscopy (EELS).